Fault Simulation and Test Pattern Generation for Cross-gate Defects in FinFET Circuits. - Kuan-Ying Chiang; Yu-Hao Ho; Yo-Wei Chen; Cheng-Sheng Pan; James Chien-Mo Li (ATS, 2015)

TARGET: Timing-AwaRe Gate Exhaustive Transition ATPG for cell-internal defects. - Ang-Feng Lin; Kuan-Yu Liao; Kuan-Ying Chiang; James Chien-Mo Li (VLSI-DAT, 2015)