Performance and reliability improvement of flash device by a novel programming method. - Chia-Huai Ho; Kuei-Shu Chang-Liao; Ya-Nan Huang; Tien-Ko Wang; T. C. Lu (Microelectron. Reliab., 2007)

Employing vertical dielectric layers to improve the operation performance of flash memory devices. - Chia-Huai Ho; Kuei-Shu Chang-Liao; Chun-Yuan Lu; Chun-Chang Lu; Tien-Ko Wang (Microelectron. Reliab., 2009)

Tunneling component suppression in charge pumping measurement and reliability study for high-k gated MOSFETs. - Chun-Chang Lu; Kuei-Shu Chang-Liao; Chun-Yuan Lu; Shih-Cheng Chang; Tien-Ko Wang; Fu-Chung Hou; Yao-Tung Hsu (Microelectron. Reliab., 2011)

Gate leakage current suppression and reliability improvement for ultra-low EOT Ge MOS devices by suitable HfAlO/HfON thickness and sintering temperature. - Wei-Fong Chi; Kuei-Shu Chang-Liao; Shih-Han Yi; Chen-Chien Li; Yan-Lin Li (Microelectron. Reliab., 2015)

Improved reliability of large-sized a-Si thin-film-transistor by back channel treatment in H2. - Hao-Chieh Lee; Kuei-Shu Chang-Liao; Yan-Lin Li (Microelectron. Reliab., 2015)

Improved reliability characteristics of Ge MOS devices by capping Hf or Zr on interfacial layer. - Yan-Lin Li; Kuei-Shu Chang-Liao; Yu-Wei Chang; Tse-Jung Huang; Chen-Chien Li; Zhao-Chen Gu; Po-Yen Chen; Tzung-Yu Wu; Jiayi Huang; Fu-Chuan Chu; Shih-Han Yi (Microelectron. Reliab., 2017)

A new erase method for scaled NAND flash memory device. - Chan-Ching Lin; Kuei-Shu Chang-Liao; Tzung-Bin Huang; Cheng-Jung Yu; Hsueh-Chao Ko (Microelectron. Reliab., 2017)

SiO2 tunneling and Si3N4/HfO2 trapping layers formed with low temperature processes on gate-all-around junctionless charge-trapping flash memory devices. - Hsin-Kai Fang; Kuei-Shu Chang-Liao; Chia-Hsin Cheng; Po-Yao Lin; Wen-Hsien Huang; Chang-Hong Shen; Jia-Min Shieh (Microelectron. Reliab., 2018)

Opto Field-Effect Transistors for Detecting Quercetin-Cu2+ Complex. - Pradhana Jati Budhi Laksana; Li-Chu Tsai; Chang-Cheng Lin; Kuei-Shu Chang-Liao; Mathew K. Moodley; Chii-Dong Chen (Sensors, 2022)