A circular pipeline processing based deterministic parallel test pattern generator. - Kuen-Wei Yeh; Jiun-Lang Huang; Hao-Jan Chao; Laung-Terng Wang (ITC, 2013)

SDC-TPG: A Deterministic Zero-Inflation Parallel Test Pattern Generator. - Chun-Hao Chang; Kuen-Wei Yeh; Jiun-Lang Huang; Laung-Terng Wang (ATS, 2015)

CPP-ATPG: A Circular Pipeline Processing Based Deterministic Parallel Test Pattern Generator. - Kuen-Wei Yeh; Jiun-Lang Huang; Laung-Terng Wang (J. Electron. Test., 2016)

DSSP-ATPG: A Deterministic Search-Space Parallel Test Pattern Generator. - Kuen-Wei Yeh; Jiun-Lang Huang (ITC-Asia, 2020)