Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance. - Kumar L. Parthasarathy; Le Jin; Turker Kuyel; Dana Price; Degang Chen 001; Randall L. Geiger (ISCAS (5), 2003)

Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs. - Le Jin; Kumar L. Parthasarathy; Turker Kuyel; Degang Chen 001; Randall L. Geiger (ITC, 2003)

BIST and production testing of ADCs using imprecise stimulus. - Kumar L. Parthasarathy; Turker Kuyel; Dana Price; Le Jin; Degang Chen 001; Randall L. Geiger (ACM Trans. Design Autom. Electr. Syst., 2003)

High-performance ADC linearity test using low-precision signals in non-stationary environments. - Le Jin; Kumar L. Parthasarathy; Turker Kuyel; Randall L. Geiger; Degang Chen 001 (ITC, 2005)

A 16-bit resistor string DAC with full-calibration at final test. - Kumar L. Parthasarathy; Turker Kuyel; Zhongjun Yu; Degang Chen 001; Randall L. Geiger (ITC, 2005)

Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal. - Le Jin; Kumar L. Parthasarathy; Turker Kuyel; Degang Chen 001; Randall L. Geiger (IEEE Trans. Instrum. Meas., 2005)