Universal fault simulation using fault tuples. - Kumar N. Dwarakanath; Ronald D. Blanton (DAC, 2000)

Universal test generation using fault tuples. - Rao Desineni; Kumar N. Dwarakanath; Ronald D. Blanton (ITC, 2000)

Fault Tuples in Diagnosis of Deep-Submicron Circuits. - Ronald D. Blanton; John T. Chen; Rao Desineni; Kumar N. Dwarakanath; Wojciech Maly; Thomas J. Vogels (ITC, 2002)

Exploiting Dominance and Equivalence using Fault Tuples. - Kumar N. Dwarakanath; R. D. (Shawn) Blanton (VTS, 2002)

Analyzing the Effectiveness of Multiple-Detect Test Sets. - R. D. (Shawn) Blanton; Kumar N. Dwarakanath; Anirudh B. Shah (ITC, 2003)

Compact Dictionaries for Diagnosis of Unmodeled Faults in Scan-BIST. - Chunsheng Liu; Kumar N. Dwarakanath; Krishnendu Chakrabarty; Ronald D. Blanton (ISVLSI, 2004)

Generalized Sensitization using Fault Tuples. - Sounil Biswas; Kumar N. Dwarakanath; R. D. (Shawn) Blanton (VTS, 2004)

A reconfigurable design-for-debug infrastructure for SoCs. - Miron Abramovici; Paul Bradley; Kumar N. Dwarakanath; Peter Levin; Gérard Memmi; Dave Miller (DAC, 2006)

Defect Modeling Using Fault Tuples. - Ronald D. Blanton; Kumar N. Dwarakanath; Rao Desineni (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006)