Impact of temperature and interface trapped charges variation on the Analog/RF and linearity of vertically extended drain double gate Si0.5Ge0.5 source tunnel FET. - Pallavi Kumari; Anand Raj; Kumari Nibha Priyadarshani; Sangeeta Singh (Microelectron. J., 2021)

RF & linearity distortion sensitivity analysis of DMG-DG-Ge pocket TFET with hetero dielectric. - Kumari Nibha Priyadarshani; Sangeeta Singh; Alok Naugarhiya (Microelectron. J., 2021)