A Novel Approach for Parameter Determination of HBT Small-Signal Equivalent Circuit. - Han-Yu Chen; Kun-Ming Chen; Guo-Wei Huang; Chun-Yen Chang 002 (IEICE Trans. Electron., 2005)

Noise Parameters Computation of Microwave Devices Using Genetic Algorithms. - Han-Yu Chen; Guo-Wei Huang; Kun-Ming Chen; Chun-Yen Chang 002 (IEICE Trans. Electron., 2005)

A Cascade Open-Short-Thru (COST) De-Embedding Method for Microwave On-Wafer Characterization and Automatic Measurement. - Ming-Hsiang Cho; Guo-Wei Huang; Chia-Sung Chiu; Kun-Ming Chen; An-Sam Peng; Yu-Min Teng (IEICE Trans. Electron., 2005)

RF MOSFET Characterization by Four-Port Measurement. - Shih-Dao Wu; Guo-Wei Huang; Kun-Ming Chen; Hua-Chou Tseng; Tsun-Lai Hsu; Chun-Yen Chang 002 (IEICE Trans. Electron., 2005)

Electrical stress effect on RF power characteristics of SiGe hetero-junction bipolar transistors. - Sheng-Yi Huang; Kun-Ming Chen; Guo-Wei Huang; Cheng-Chou Hung; Wen-Shiang Liao; Chun-Yen Chang 002 (Microelectron. Reliab., 2008)

A simple extraction method for parasitic series resistances in GaN HEMTs considering non-quasi-static effects. - Venkatesan Nagarajan; Kun-Ming Chen; Huan-Chung Wang; Sankalp Kumar Singh; Deepak Anandan; Yueh-Chin Lin; Edward Yi Chang (Microelectron. J., 2019)

Machine Learning-Based Approach to Analyze the Effect of Density of States on the Electrical Properties of a-IGZO TFT. - Xiu-Zhi Chen; Da Zheng Lin; Shih-Shin Hu; Hsin-Hui Hu; Yen-Lin Chen; Kun-Ming Chen (ICCE-TW, 2022)

The Electrical Properties of a-IGZO TFT Prediction Based on Variational Autoencoder Model. - Shih-Shin Hu; Kean-Thye Bea; Wei-Hsuan Lin; Da Zheng Lin; Xiu-Zhi Chen; Ting-Ru Lin; Hsin-Hui Hu; Yen-Lin Chen; Kun-Ming Chen; Wai-Khuen Cheng (ICCE-Taiwan, 2023)

Prediction of Electrical Characteristics of a-IGZO TFT Based on Transfer Learning-Based Variational Autoencoder. - Khean Thye Bea; Shih-Shin Hu; Wei-Hsuan Lin; Da Zheng Lin; Hsin-Hui Hu; Xiu-Zhi Chen; Ting-Ru Lin; Yen-Lin Chen; Kun-Ming Chen; Wai-Khuen Cheng (SMC, 2023)