A Pattern Generation Technique for Maximizing Power Supply Currents. - Kunal P. Ganeshpure; Alodeep Sanyal; Sandip Kundu (ICCD, 2006)

Interactive presentation: Automatic test pattern generation for maximal circuit noise in multiple aggressor crosstalk faults. - Kunal P. Ganeshpure; Sandip Kundu (DATE, 2007)

Accelerating Soft Error Rate Testing Through Pattern Selection. - Alodeep Sanyal; Kunal P. Ganeshpure; Sandip Kundu (IOLTS, 2007)

A Study on Impact of Leakage Current on Dynamic Power. - Ashesh Rastogi; Kunal P. Ganeshpure; Sandip Kundu (ISCAS, 2007)

On Accelerating Soft-Error Detection by Targeted Pattern Generation. - Alodeep Sanyal; Kunal P. Ganeshpure; Sandip Kundu (ISQED, 2007)

On ATPG for multiple aggressor crosstalk faults in presence of gate delays. - Kunal P. Ganeshpure; Sandip Kundu (ITC, 2007)

On Composite Leakage Current Maximization. - Ashesh Rastogi; Kunal P. Ganeshpure; Alodeep Sanyal; Sandip Kundu (J. Electron. Test., 2008)

Reducing temperature variability by routing heat pipes. - Kunal P. Ganeshpure; Ilia Polian; Sandip Kundu; Bernd Becker 001 (ACM Great Lakes Symposium on VLSI, 2009)

An ILP Based ATPG Technique for Multiple Aggressor Crosstalk Faults Considering the Effects of Gate Delays. - Kunal P. Ganeshpure; Sandip Kundu (VLSI Design, 2009)

An Improved Soft-Error Rate Measurement Technique. - Alodeep Sanyal; Kunal P. Ganeshpure; Sandip Kundu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009)

On ATPG for Multiple Aggressor Crosstalk Faults. - Kunal P. Ganeshpure; Sandip Kundu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010)

Task model for on-chip communication infrastructure design for multicore systems. - Bharath Phanibhushana; Kunal P. Ganeshpure; Sandip Kundu (ICCD, 2011)

Maximizing hotspot temperature: Wavelet based modelling of heating and cooling profile of functional workloads. - Sudarshan Srinivasan; Kunal P. Ganeshpure; Sandip Kundu (ISQED, 2011)

Reducing Temperature Variation in 3D Integrated Circuits Using Heat Pipes. - Kunal P. Ganeshpure; Sandip Kundu (ISVLSI, 2012)

A DFT Methodology for Repairing Embedded Memories of Large MPSoCs. - Kunal P. Ganeshpure; Sandip Kundu (ISVLSI, 2012)

A Pattern Generation Technique for Maximizing Switching Supply Currents Considering Gate Delays. - Kunal P. Ganeshpure; Alodeep Sanyal; Sandip Kundu (IEEE Trans. Computers, 2012)

A Wavelet-Based Spatio-Temporal Heat Dissipation Model for Reordering of Program Phases to Produce Temperature Extremes in a Chip. - Sudarshan Srinivasan; Kunal P. Ganeshpure; Sandip Kundu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Test Pattern Generation for Multiple Aggressor Crosstalk Effects Considering Gate Leakage Loading in Presence of Gate Delays. - Alodeep Sanyal; Kunal P. Ganeshpure; Sandip Kundu (IEEE Trans. Very Large Scale Integr. Syst., 2012)

On runtime task graph extraction in MPSoC. - Kunal P. Ganeshpure; Sandip Kundu (ISVLSI, 2013)

Game theoretic approach for run-time task scheduling on an multi-processor system on chip. - Kunal P. Ganeshpure; Sandip Kundu (IET Circuits Devices Syst., 2013)

Performance-driven dynamic thermal management of MPSoC based on task rescheduling. - Kunal P. Ganeshpure; Sandip Kundu (ACM Trans. Design Autom. Electr. Syst., 2014)