Fault-coverage Maximizing March Tests for Memory Testing. - Feng Yun; Yunkun Lin; Lou Yunfei; Lei Gao; Vaibhav Gera; Boxuan Li; Vennela Chowdary Nekkanti; Aditya Rajendra Pharande; Kunal Sheth; Meghana Thommondru; Guizhong Ye; Sandeep Gupta 001 (ITC, 2022)

SMT-D: New Strategies for Portfolio-Based SMT Solving. - Clark W. Barrett; Pei-Wei Chen; Byron Cook; Bruno Dutertre; Robert B. Jones; Nham Le; Andrew Reynolds 001; Kunal Sheth; Christopher Stephens; Michael W. Whalen (FMCAD, 2024)