Weight-Update Characteristics Dependent on Carrier Densities of Hf-ZnO Charge-Trap Layers in Sub-Threshold Synaptic Transistors. - Kunhee Tae; Danyoung Cha; Gyoungyeop do; Nayeong Lee; Sungsik Lee (IEEE Access, 2024)

Retention Characteristics Dependent on High-κ Gate-Insulator Stack in Hf-ZnO Synaptic Thin-Film Transistors. - Gyoungyeop do; Danyoung Cha; Kunhee Tae; Nayeong Lee; Seokhyun Byun; Jeongseok Pi; Sungsik Lee (IEEE Access, 2024)