ESD tests on 850 nm GaAs-based VCSELs. - Massimo Vanzi; Giovanna Mura; Giulia Marcello; Kunhui Xiao (Microelectron. Reliab., 2016)

Failure analysis of projected capacitance touch panel liquid crystal displays - Two case studies. - Jia Lu; Zhennian Cao; ChuangJun Huang; Kunhui Xiao; Alan Street; YuFeng Dai (Microelectron. Reliab., 2017)