On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST). - Seyed Nima Mozaffari; Bonita Bhaskaran; Shantanu Sarangi; Suhas M. Satheesh; Kuo Lin Fu; Nithin Valentine; P. Manikandan; Mahmut Yilmaz (VTS, 2022)