Layout-Aware Scan Chain Reorder for Skewed-Load Transition Test Coverage. - Sying-Jyan Wang; Kuo-Lin Peng; Katherine Shu-Min Li (ATS, 2006)

Layout-aware scan chain reorder for launch-off-shift transition test coverage. - Sying-Jyan Wang; Kuo-Lin Peng; Kuang-Cyun Hsiao; Katherine Shu-Min Li (ACM Trans. Design Autom. Electr. Syst., 2008)