A robust ADC code hit counting technique. - Jiun-Lang Huang; Kuo-Yu Chou; Ming-Huan Lu; Xuan-Lun Huang (DATE, 2010)

A 0.66e-rms temporal-readout-noise 3D-stacked CMOS image sensor with conditional correlated multiple sampling (CCMS) technique. - Shang-Fu Yeh; Kuo-Yu Chou; Honyih Tu; Calvin Yi-Ping Chao; Fu-Lung Hsueh (VLSIC, 2015)

Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method. - Calvin Yi-Ping Chao; Honyih Tu; Thomas Meng-Hsiu Wu; Kuo-Yu Chou; Shang-Fu Yeh; Chin Yin; Chih-Lin Lee (Sensors, 2017)

A 45 nm Stacked CMOS Image Sensor Process Technology for Submicron Pixel. - Seiji Takahashi; Yi-Min Huang; Jhy-Jyi Sze; Tung-Ting Wu; Fu-Sheng Guo; Wei-Cheng Hsu; Tung-Hsiung Tseng; King Liao; Chin-Chia Kuo; Tzu-Hsiang Chen; Wei-Chieh Chiang; Chun-Hao Chuang; et al. (Sensors, 2017)

A 0.66erms- Temporal-Readout-Noise 3-D-Stacked CMOS Image Sensor With Conditional Correlated Multiple Sampling Technique. - Shang-Fu Yeh; Kuo-Yu Chou; Honyih Tu; Calvin Yi-Ping Chao; Fu-Lung Hsueh (IEEE J. Solid State Circuits, 2018)

Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors. - Calvin Yi-Ping Chao; Shang-Fu Yeh; Meng-Hsu Wu; Kuo-Yu Chou; Honyih Tu; Chih-Lin Lee; Chin Yin; Philippe Paillet; Vincent Goiffon (Sensors, 2019)