STEM image analysis based on deep learning: identification of vacancy defects and polymorphs of MoS2. - Kihyun Lee; Jinsub Park; Soyeon Choi; Yangjin Lee; Sol Lee; Joowon Jung; Jong-Young Lee; Farman Ullah; Zeeshan Tahir; Yong Soo Kim; Gwan-Hyoung Lee; Kwanpyo Kim (CoRR, 2022)

Ultrathin Gate Dielectric Enabled by Nanofog Aluminum Oxide on Monolayer MoS2. - Jung-Soo Ko; Zichen Zhang 019; Sol Lee; Marc Jaikissoon; Robert K. A. Bennett; Kwanpyo Kim; Andrew C. Kummel; Prabhakar Bandaru; Eric Pop; Krishna C. Saraswat (ESSDERC, 2023)

Achieving 1-nm-Scale Equivalent Oxide Thickness Top Gate Dielectric on Monolayer Transition Metal Dichalcogenide Transistors with CMOS-Friendly Approaches. - Jung-Soo Ko; Alex Shearer; Sol Lee; Kathryn M. Neilson; Marc Jaikissoon; Kwanpyo Kim; Stacey Bent; Krishna Saraswat; Eric Pop (VLSI Technology and Circuits, 2024)