Drain Current Degradation Induced by Charge Trapping/De-Trapping in Fe-FET. - Taeyoung Kim; Suhwan Lim; Ilho Myeong; Sanghyun Park; Suseong Noh; Seung Min Lee; Jongho Woo; Hanseung Ko; Youngji Noh; Moonkang Choi; Kiheun Lee; Sangwoo Han; et al. (IRPS, 2024)