Hybrid Test Access Mechanism for Multiple Identical Cores. - Sangjun Lee; Jongho Park; Inhwan Lee; Kwonhyoung Lee; Sungho Kang 001 (ISOCC, 2021)

A Low-Power BIST Scheme Using Weight-Aware Scan Grouping and Scheduling for Automotive ICs. - Kwonhyoung Lee; Sangjun Lee; Jongho Park; Inhwan Lee; Sungho Kang 001 (IEEE Access, 2021)