A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method. - Junghyun Nam; Sunghoon Chun; Gibum Koo; Yanggi Kim; Byungsoo Moon; Jonghyoung Lim; Jaehoon Joo; Sangseok Kang; Hoonjung Kim; Kyeongseon Shin; Kisang Kang; Sungho Kang (ITC, 2008)