Error elimination ECC by horizontal error detection and vertical-LDPC ECC to increase data-retention time by 230% and acceptable bit-error rate by 90% for 3D-NAND flash SSDs. - Shun Suzuki; Yoshiaki Deguchi; Toshiki Nakamura; Kyoji Mizoguchi; Ken Takeuchi (IRPS, 2018)

Privacy-Aware Data-Lifetime Control NAND Flash System for Right to be Forgotten with In-3D Vertical Cell Processing. - Shun Suzuki; Kyoji Mizoguchi; Hikaru Watanabe; Toshiki Nakamura; Yoshiaki Deguchi; Keita Mizushina; Ken Takeuchi (A-SSCC, 2019)

Automatic Data Repair Overwrite Pulse for 3D-TLC NAND Flash Memories with 38x Data-Retention Lifetime Extension. - Kyoji Mizoguchi; Kyosuke Maeda; Ken Takeuchi (IRPS, 2019)

1.22μm 35.6Mpixel RGB Hybrid Event-Based Vision Sensor with 4.88μm-Pitch Event Pixels and up to 10K Event Frame Rate by Adaptive Control on Event Sparsity. - Kazutoshi Kodama; Yusuke Sato; Yuhi Yorikado; Raphael Berner; Kyoji Mizoguchi; Takahiro Miyazaki; Masahiro Tsukamoto; Yoshihisa Matoba; Hirotaka Shinozaki; Atsumi Niwa; Tetsuji Yamaguchi; Christian Brandli; et al. (ISSCC, 2023)

A 2.97μm-Pitch Event-Based Vision Sensor with Shared Pixel Front-End Circuitry and Low-Noise Intensity Readout Mode. - Atsumi Niwa; Futa Mochizuki; Raphael Berner; Takuya Maruyarma; Toshio Terano; Kenichi Takamiya; Yasutaka Kimura; Kyoji Mizoguchi; Takahiro Miyazaki; Shun Kaizu; Hirotsugu Takahashi; Atsushi Suzuki; et al. (ISSCC, 2023)