Correlation method of circuit-performance and technology fluctuations for improved design reliability. - D. Miyawaki; Shizunori Matsumoto; Hans Jürgen Mattausch; S. Ooshiro; Masami Suetake; Mitiko Miura-Mattausch; Shigetaka Kumashiro; Tetsuya Yamaguchi; Kyoji Yamashita; Noriaki Nakayama (ASP-DAC, 2001)

Test-circuit-based extraction of inter- and intra-chip MOSFET-performance variations for analog-design reliability. - Shizunori Matsumoto; Hans Jürgen Mattausch; S. Ooshiro; Y. Tatsumi; Mitiko Miura-Mattausch; Shigetaka Kumashiro; Terufumi Yamaguchi; Kyoji Yamashita; Noriaki Nakayama (CICC, 2001)

Circuit Simulation Models for Coming MOSFET Generations. - Mitiko Miura-Mattausch; Hiroaki Ueno; Hans Jürgen Mattausch; Shigetaka Kumashiro; Tetsuya Yamaguchi; Kyoji Yamashita; Noriaki Nakayama (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2002)

Temperature-independence-point properties for 0.1μm-scale pocket-implant technologies and the impact on circuit design. - Kazuya Hisamitsu; Hiroaki Ueno; Masayasu Tanaka; Daisuke Kitamaru; Mitiko Miura-Mattausch; Hans Jürgen Mattausch; Shigetaka Kumashiro; Tetsuya Yamaguchi; Kyoji Yamashita; Noriaki Nakayama (ASP-DAC, 2003)

A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission. - Toshihiro Matsuda; Hiroaki Takeuchi; Akira Muramatsu; Hideyuki Iwata; Takashi Ohzone; Kyoji Yamashita; Norio Koike; Ken-ichiro Tatsuuma (IEICE Trans. Electron., 2005)

1/f-Noise Characteristics in 100 nm-MOSFETs and Its Modeling for Circuit Simulation. - Shizunori Matsumoto; Hiroaki Ueno; Satoshi Hosokawa; Toshihiko Kitamura; Mitiko Miura-Mattausch; Hans Jürgen Mattausch; Tatsuya Ohguro; Shigetaka Kumashiro; Tetsuya Yamaguchi; Kyoji Yamashita; Noriaki Nakayama (IEICE Trans. Electron., 2005)

A Compact Model of the Pinch-off Region of 100 nm MOSFETs Based on the Surface-Potential. - Dondee Navarro; Takeshi Mizoguchi; Masami Suetake; Kazuya Hisamitsu; Hiroaki Ueno; Mitiko Miura-Mattausch; Hans Jürgen Mattausch; Shigetaka Kumashiro; Tetsuya Yamaguchi; Kyoji Yamashita; Noriaki Nakayama (IEICE Trans. Electron., 2005)