Modeling and Analysis of Power-Aware Systems. - Oleg Sokolsky; Anna Philippou; Insup Lee 001; Kyriakos Christou (TACAS, 2003)

Towards finding path delay fault tests with high test efficiency using ZBDDs. - Maria K. Michael; Kyriakos Christou; Spyros Tragoudas (ICCD, 2005)

Implicit Critical PDF Test Generation with Maximal Test Efficiency. - Kyriakos Christou; Maria K. Michael; Spyros Tragoudas (DFT, 2006)

Exploiting MOEA to Automatically Geneate Test Programs for Path-Delay Faults in Microprocessors. - Paolo Bernardi; Kyriakos Christou; Michelangelo Grosso; Maria K. Michael; Ernesto Sánchez 001; Matteo Sonza Reorda (EvoWorkshops, 2008)

A Novel SBST Generation Technique for Path-Delay Faults in Microprocessors Exploiting Gate- and RT-Level Descriptions. - Kyriakos Christou; Maria K. Michael; Paolo Bernardi; Michelangelo Grosso; Ernesto Sánchez 001; Matteo Sonza Reorda (VTS, 2008)

On the Use of ZBDDs for Implicit and Compact Critical Path Delay Fault Test Generation. - Kyriakos Christou; Maria K. Michael; Spyros Tragoudas (J. Electron. Test., 2008)

Generating Diverse Test Sets for Multiple Fault Detections Based on Fault Cone Partitioning. - Stelios Neophytou; Maria K. Michael; Kyriakos Christou (DFT, 2009)

Identification of critical primitive path delay faults without any path enumeration. - Kyriakos Christou; Maria K. Michael; Stelios Neophytou (VTS, 2010)

An Approach for Quantifying Path Correlation in Digital Circuits without any Path or Segment Enumeration. - Stelios Neophytou; Kyriakos Christou; Maria K. Michael (ETS, 2011)

A Non-Enumerative Technique for Measuring Path Correlation in Digital Circuits. - Stelios Neophytou; Kyriakos Christou; Maria K. Michael (J. Electron. Test., 2012)

European Test Symposium Teams: an Anniversary Snapshot. - Maksim Jenihhin; Jaan Raik; Artur Jutman; Natalia Cherezova; Raimund Ubar; Liviu Miclea; Szilárd Enyedi; I. Stefan; Ovidiu Stan; Cosmina Corches; Z. Peng; Petru Eles; et al. (ETS, 2025)