A relation model of gate oxide yield and reliability. - Kyungmee O. Kim; Way Kuo; Wen Luo (Microelectron. Reliab., 2004)

Some considerations on system burn-in. - Kyungmee O. Kim; W. Kuo (IEEE Trans. Reliab., 2005)

Relating integrated circuit yield and time-dependent reliability for various defect density distributions. - Kyungmee O. Kim (IEEE Trans. Reliab., 2006)

Two fault classification methods for large systems when available data are limited. - Kyungmee O. Kim; Ming Jian Zuo (Reliab. Eng. Syst. Saf., 2007)

Reliability functions estimated from commonly used yield models. - Kyungmee O. Kim; Hee-Seok Oh (Microelectron. Reliab., 2008)

Optimal burn-in for maximizing reliability of repairable non-series systems. - Kyungmee O. Kim; Way Kuo (Eur. J. Oper. Res., 2009)

Burn-in considering yield loss and reliability gain for integrated circuits. - Kyungmee O. Kim (Eur. J. Oper. Res., 2011)

Extending the Scope of Empirical Mode Decomposition by Smoothing. - Donghoh Kim; Kyungmee O. Kim; Hee-Seok Oh (EURASIP J. Adv. Signal Process., 2012)

A new reliability allocation weight for reducing the occurrence of severe failure effects. - Kyungmee O. Kim; Yoonjung Yang; Ming Jian Zuo (Reliab. Eng. Syst. Saf., 2013)

Derating design for optimizing reliability and cost with an application to liquid rocket engines. - Kyungmee O. Kim; Taeseong Roh; Jae-Woo Lee; Ming Jian Zuo (Reliab. Eng. Syst. Saf., 2016)

General model for the risk priority number in failure mode and effects analysis. - Kyungmee O. Kim; Ming Jian Zuo (Reliab. Eng. Syst. Saf., 2018)

Optimal allocation of reliability improvement target based on the failure risk and improvement cost. - Kyungmee O. Kim; Ming Jian Zuo (Reliab. Eng. Syst. Saf., 2018)

Reliability maximization of a load-sharing system without redundant components. - Kyungmee O. Kim; Seongjun Park; Yujin Hong (Qual. Reliab. Eng. Int., 2023)