Oxide Soft Breakdown : From device modeling to small circuit simulation. - L. Gerrer; Gérard Ghibaudo; G. Ribes (ESSCIRC, 2009)

Electronic transport through GaN/AlN single barriers: Effect of polarisation and dislocations. - S. Leconte; L. Gerrer; Eva Monroy (Microelectron. J., 2009)

Unified soft breakdown MOSFETs compact model: From experiments to circuit simulation. - L. Gerrer; M. Rafik; G. Ribes; Gérard Ghibaudo; E. Vincent (Microelectron. Reliab., 2010)