Degradation Based Long-Term Reliability Assessment for Electronic Components in Submarine Applications. - V. Lista; P. Garbossa; T. Tomasi; Mattia Borgarino; Fausto Fantini; L. Gherardi; A. Righetti; M. Villa (Microelectron. Reliab., 2002)

Passive optical components: from degradation data to reliability assessment - preliminary results. - T. Tomasi; Ilaria De Munari; V. Lista; L. Gherardi; A. Righetti; M. Villa (Microelectron. Reliab., 2002)