A Novel Approach to Test Generation for VLSI. - C. Timoc; F. Stott; L. Hess (COMPCON, 1982)

Logical Models of Physical Failures. - C. Timoc; M. Buehler; T. Griswold; C. Pina; F. Stott; L. Hess (ITC, 1983)

Adaptive Self-Test for a Microprocessor. - C. Timoc; F. Stott; K. Wickman; L. Hess (ITC, 1983)