Architecture and performance characterization of hardware and software implementations of the Crozier frequency estimation algorithm. - L.-P. Lafrance; Marc-André Cantin; Yvon Savaria; S. H. Sung; Pierre Lavoie (ISCAS (4), 2002)

An Integrated Test Platform for Nanostructure Electrical Characterization. - Olivier Duval; L.-P. Lafrance; Yvon Savaria; Patrick Desjardins (ICMENS, 2004)

A Framework for Implementing Reusable Digital Signal Processing Modules. - L.-P. Lafrance; Yvon Savaria (IWSOC, 2004)