Understanding gate metal work function (mWF) impact on device reliability - A holistic approach. - P. Srinivasan; Rakesh Ranjan; S. Cimino; A. Zainuddin; B. Kannan; L. Pantisano; I. Mahmud; G. Dilliway; Tanya Nigam (IRPS, 2018)

Self-heating characterization and its applications in technology development. - Peter C. Paliwoda; Maria Toledano-Luque; Tanya Nigam; Fernando Guarin; M. Nour; S. Cimino; L. Pantisano; A. Gupta; Oscar Huerta-Gonzalez; M. Hauser; W. Liu; A. Vayshenker; et al. (NATW, 2020)

Method to evaluate off-state breakdown in scaled Tri-gate technologies. - D. Nminibapiel; K. Joshi; R. Ramamurthy; L. Pantisano; Inanc Meric; Stephen Ramey (IRPS, 2022)

A detailed comparison of various off-state breakdown methodologies for scaled Tri-gate technologies. - K. Joshi; D. Nminibapiel; M. Ghoneim; D. Ali; R. Ramamurthy; L. Pantisano; Inanc Meric; Stephen Ramey (IRPS, 2023)

Intel PowerVia Technology: Backside Power Delivery for High Density and High-Performance Computing. - Walid M. Hafez; P. Agnihotri; M. Asoro; M. Aykol; B. Bains; Rohan Bambery; M. Bapna; A. Barik; A. Chatterjee; P. C. Chiu; T. Chu; C. Firby; et al. (VLSI Technology and Circuits, 2023)