Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications. - M. L. Bourqui; Laurent Béchou; Olivier Gilard; Yannick Deshayes; Pamela Del Vecchio; L. S. How; F. Rosala; Yves Ousten; André Touboul (Microelectron. Reliab., 2008)

Investigations on electro-optical and thermal performances degradation of high power density GaAs-based laser diode in vacuum environment. - Jérémy Michaud; Guillaume Pedroza; Laurent Béchou; L. S. How; Olivier Gilard; David Veyrié; F. Laruelle; Stéphane Grauby (Microelectron. Reliab., 2015)