FIODBS: An Interoperable Object-Database System. - X. Xuebiao; Ning Gu; Baile Shi; T. Chun; L. Sheng; W. Mengzhi (TOOLS (24), 1997)

Device reliability for CMOS image sensors with backside through-silicon vias. - Jeff Peter Gambino; H. Soleimani; I. Rahim; B. Riebeek; L. Sheng; G. Hosey; H. Truong; Gavin D. R. Hall; R. Jerome; D. Price (IRPS, 2018)

Reliability of an Al2O3/SiO2MIM Capacitor for 180nm (3.3V) Technology. - Jeff Gambino; Derryl D. J. Allman; Gavin D. R. Hall; D. Price; L. Sheng; R. Takada; Y. Kanuma (IRPS, 2019)