Switching performance of 65 V vertical N-channel FLYMOSFETs. - L. Théolier; Karine Isoird; H. Tranduc; Frederic Morancho; Jaume Roig; Yann Weber; Evgueniy N. Stefanov; Jean-Michel Reynes (Microelectron. J., 2008)

Electrical characterization under mechanical stress at various temperatures of PiN power diodes in a health monitoring approach. - F. Baccar; Stephane Azzopardi; L. Théolier; K. El Boubkari; Jean-Yves Delétage; Eric Woirgard (Microelectron. Reliab., 2013)

Mechanical stress investigation after technological process in Deep Trench Termination DT2 using BenzoCycloButene as dielectric material. - Houssam Arbess; F. Baccar; L. Théolier; Stephane Azzopardi; Eric Woirgard (Microelectron. Reliab., 2015)

Ageing mechanisms in Deep Trench Termination (DT2) Diode. - F. Baccar; Houssam Arbess; L. Théolier; Stephane Azzopardi; Eric Woirgard (Microelectron. Reliab., 2015)

Identification and analysis of power substrates degradations subjected to severe aging tests. - Eric Woirgard; Faical Arabi; Wissam Sabbah; Donatien Martineau; L. Théolier; Stephane Azzopardi (Microelectron. Reliab., 2015)

Power electronic assemblies: Thermo-mechanical degradations of gold-tin solder for attaching devices. - Faical Arabi; Loic Théolier; Donatien Martineau; Jean-Yves Delétage; M. Medina; Eric Woirgard (Microelectron. Reliab., 2016)

Lifetime of power electronics interconnections in accelerated test conditions: High temperature storage and thermal cycling. - Wissam Sabbah; Faical Arabi; Oriol Avino-Salvado; Cyril Buttay; L. Théolier; Hervé Morel (Microelectron. Reliab., 2017)

Temperature and voltage effects on HTRB and HTGB stresses for AlGaN/GaN HEMTs. - Omar Chihani; Loic Théolier; Jean-Yves Delétage; Eric Woirgard; Alain Bensoussan 002; André Durier (IRPS, 2018)

Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses. - Omar Chihani; L. Théolier; Alain Bensoussan 002; Jean-Yves Delétage; André Durier; Eric Woirgard (Microelectron. Reliab., 2018)