Assessment of the Transient Self-Heating Effect and its Impact on the Performance of Watt-Level RF Power Amplifier in a FinFET Technology. - T. V. Dinh; S.-W. Tam; A. J. Scholten; L. Tondelli; R. M. T. Pijper; S. H. Kondapalli; J. Xie; A. Wong; I. To; R. Asanovski; L. Selmi (VLSI Technology and Circuits, 2024)

Distinct Signatures of Self-Heating and Trap Dynamics on the AC Y-Parameters of Advanced n-MOSFETs. - L. Tondelli; A. J. Scholten; J. Van Beurden; R. M. T. Pijper; R. Asanovski; T. V. Dinh; L. Selmi (IRPS, 2025)