Experimental and simulation analysis of a BCD ESD protection element under the DC and TLP stress conditions. - M. Blaho; Dionyz Pogany; L. Zullino; A. Andreini; Erich Gornik (Microelectron. Reliab., 2002)

A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress. - Viktor Dubec; Sergey Bychikhin; M. Blaho; Dionyz Pogany; Erich Gornik; J. Willemen; Ning Qu; Wolfgang Wilkening; L. Zullino; A. Andreini (Microelectron. Reliab., 2003)

Study of CDM specific effects for a smart power input protection structure. - M. Etherton; Ning Qu; J. Willemen; Wolfgang Wilkening; S. Mettler; Mariano Dissegna; R. Stella; L. Zullino; A. Andreini; Horst A. Gieser (Microelectron. Reliab., 2006)