CLAPS: A Graph Clustering-Based Approach for Partial Scan Design. - Jaeyoung Joung; Sangjun Lee; Jongho Park; Jaehyun Kim; Laesang Jung; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2026)

TOPS: Topology-Based Partial Scan for Stuck-At and Delay Testing. - Sangjun Lee; Jongho Park; Jaeyoung Joung; Jaehyun Kim; Laesang Jung; Sungho Kang 001 (IEEE Trans. Circuits Syst. I Regul. Pap., 2026)