Fault Diagnosis in Microelectronics Attachment via Deep Learning Analysis of 3D Laser Scans. - Nikolaos Dimitriou; Lampros Leontaris; Thanasis Vafeiadis; Dimosthenis Ioannidis; Tracy Wotherspoon; Gregory Tinker; Dimitrios Tzovaras (CoRR, 2020)

A Deep Learning framework for simulation and defect prediction applied in microelectronics. - Nikolaos Dimitriou; Lampros Leontaris; Thanasis Vafeiadis; Dimosthenis Ioannidis; Tracy Wotherspoon; Gregory Tinker; Dimitrios Tzovaras (Simul. Model. Pract. Theory, 2020)

Fault Diagnosis in Microelectronics Attachment Via Deep Learning Analysis of 3-D Laser Scans. - Nikolaos Dimitriou; Lampros Leontaris; Thanasis Vafeiadis; Dimosthenis Ioannidis; Tracy Wotherspoon; Gregory Tinker; Dimitrios Tzovaras (IEEE Trans. Ind. Electron., 2020)

An Autonomous Illumination System for Vehicle Documentation Based on Deep Reinforcement Learning. - Lampros Leontaris; Nikolaos Dimitriou; Dimosthenis Ioannidis; Konstantinos Votis; Dimitrios Tzovaras; Elpiniki Papageorgiou (IEEE Access, 2021)

PCB 3D inspection from 2D images. - Apostolos Evangelidis; Nikolaos Dimitriou; Lampros Leontaris; Dimosthenis Ioannidis; Gregory Tinker; Dimitrios Tzovaras (IEEE DataPort, 2022)

A Deep Regression Framework Toward Laboratory Accuracy in the Shop Floor of Microelectronics. - Apostolos Evangelidis; Nikolaos Dimitriou; Lampros Leontaris; Dimosthenis Ioannidis; Gregory Tinker; Dimitrios Tzovaras (IEEE Trans. Ind. Informatics, 2023)

A blockchain-enabled deep residual architecture for accountable, in-situ quality control in industry 4.0 with minimal latency. - Lampros Leontaris; Andreana Mitsiaki; Paschalis Charalampous; Nikolaos Dimitriou; Eleni Leivaditou; Aristoklis Karamanidis; George Margetis; Konstantinos C. Apostolakis; Sebastián Pantoja; Constantine Stephanidis; Dimitrios Tzovaras; Elpiniki Papageorgiou (Comput. Ind., 2023)