A theoretical analysis on cloning the failed test cases to improve spectrum-based fault localization. - Long Zhang; Lanfei Yan; Zhenyu Zhang 004; Jian Zhang 001; W. K. Chan 001; Zheng Zheng 001 (J. Syst. Softw., 2017)

MURE: Making Use of MUtations to REfine Spectrum-Based Fault Localization. - Zijie Li; Lanfei Yan; Yuzhen Liu; Zhenyu Zhang 004; Bo Jiang 001 (QRS Companion, 2018)