Run-to-run process control for chemical mechanical polishing in semiconductor manufacturing. - Li Da; Varadarajan Ganesh Kumar; Arthur Tay; Abdullah Al Mamun 002; Weng Khuen Ho; Alex See; Lap Chan (ISIC, 2002)

Mechanism of nitrogen-enhanced negative bias temperature instability in pMOSFET. - Shyue Seng Tan; Tupei Chen; Chew Hoe Ang; Lap Chan (Microelectron. Reliab., 2005)

Dynamic NBTI lifetime model for inverter-like waveform. - Shyue Seng Tan; Tupei Chen; Lap Chan (Microelectron. Reliab., 2005)