Prozeßbegleitende Bestimmung von Defektdichten in hochintegrierten Schaltungen - Larg Weiland (1998)

In-Product BTI Aging Sensor for Reliability Screening and Early Detection of Material at Risk. - Tomasz Brozek; Alberto A. P. Cattaneo; Larg Weiland; Michele Quarantelli; Alberto Coccoli; Sharad Saxena; Christopher Hess; Andrzej J. Strojwas (IRPS, 2023)