Efficient and accurate method for intra-gate defect diagnoses in nanometer technology and volume data. - Aymen Ladhar; Mohamed Masmoudi; Laroussi Bouzaida (DATE, 2009)

Comprehensive bridging fault diagnosis based on the SLAT paradigm. - Youssef Benabboud; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Laroussi Bouzaida; Isabelle Izaute (DDECS, 2009)

A case study on logic diagnosis for System-on-Chip. - Youssef Benabboud; Alberto Bosio; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Laroussi Bouzaida; Isabelle Izaute (ISQED, 2009)