On the influence of the variation of measurement conditions on the FNT characteristics of stressed thin silicon oxides. - Jan-Werner Zahlmann-Nowitzki; Lars Nebrich; Peter Seegebrecht (Microelectron. Reliab., 2001)

Silicon-interposer with high density Cu-filled TSVs. - Robert Wieland; Kai Zoschke; Nils Jurgensen; Karl-Reinhard Merkel; Lars Nebrich; Jürgen Wolf (3DIC, 2010)