Smart MEMS concept for high secure RF and millimeterwave communications. - David Dubuc; M. Saddaoui; S. Mellé; F. Flourens; L. Rabbia; Benoit Ducarouge; Katja Grenier; Patrick Pons; Ali Boukabache; Laurent Bary (Microelectron. Reliab., 2004)

Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications. - Nicolas Guitard; David Trémouilles; Marise Bafleur; Laurent Escotte; Laurent Bary; Philippe Perdu; Gérard Sarrabayrouse; Nicolas Nolhier; Roberto Reyna-Rojas (Microelectron. Reliab., 2004)

Failure predictive model of capacitive RF-MEMS. - S. Mellé; D. De Conto; L. Mazenq; David Dubuc; B. Poussard; C. Bordas; Katja Grenier; Laurent Bary; Olivier Vendier; J. L. Muraro (Microelectron. Reliab., 2005)

Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements. - Yuan Gao; Nicolas Guitard; Christophe Salamero; Marise Bafleur; Laurent Bary; Laurent Escotte; Patrick Gueulle; Lionel Lescouzères (Microelectron. Reliab., 2007)

Electrostatic discharge failure analysis of capacitive RF MEMS switches. - Jinyu Jason Ruan; Nicolas Nolhier; Marise Bafleur; Laurent Bary; Fabio Coccetti; T. Lisec; Robert Plana (Microelectron. Reliab., 2007)

Advanced Low-Noise X-Ray Readout ASIC for Radiation Sensor Interfaces. - Thomas Noulis; Stylianos Siskos; Gérard Sarrabayrouse; Laurent Bary (IEEE Trans. Circuits Syst. I Regul. Pap., 2008)