Prediction of long-term thermal behavior of an irradiated SRAM based on isochronal annealing measurements. - F. Saigné; Olivier Quittard; Laurent Dusseau; F. Joffre; Coumar Oudéa; J. Fesquet; Jean Gasiot (Microelectron. Reliab., 2002)

First studies of the impact of dose radiation on the electromagnetic susceptibility of bipolar transistors. - Sylvie Jarrix; Laurent Dusseau; Nathalie Chatry; Patrick Hoffmann; Adrien Doridant; A. Blain; Tristan Dubois; Jérémy Raoult; Philippe Calvel (LATW, 2011)

Modeling dose effects in electronics devices: Dose and temperature dependence of power MOSFET. - Alain Michez; Jerome Boch; S. Dhombres; Frédéric Saigné; Antoine D. Touboul; J.-R. Vaillé; Laurent Dusseau; E. Lorfèvre; R. Ecoffet (Microelectron. Reliab., 2013)

Robotic test bench for CubeSat ground testing: Concept and satellite dynamic parameter identification. - Irina Gavrilovich; Sébastien Krut; Marc Gouttefarde; François Pierrot; Laurent Dusseau (IROS, 2015)