A cost-effective technique for extending the low-frequency range of a microwave noise parameter test set. - Laurent Escotte; Jean-Guy Tartarin; Jacques Graffeuil (IEEE Trans. Instrum. Meas., 1999)

On-wafer noise characterization of low-noise amplifiers in the Ka-band. - Sabine Long; Laurent Escotte; Jacques Graffeuil; F. Brasseau; J. L. Cazaux (IEEE Trans. Instrum. Meas., 2003)

Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications. - Nicolas Guitard; David Trémouilles; Marise Bafleur; Laurent Escotte; Laurent Bary; Philippe Perdu; Gérard Sarrabayrouse; Nicolas Nolhier; Roberto Reyna-Rojas (Microelectron. Reliab., 2004)

Long-term reliability of silicon bipolar transistors subjected to low constraints. - A. Crosson; Laurent Escotte; Marise Bafleur; D. Talbourdet; L. Crétinon; Philippe Perdu; Guy Perez (Microelectron. Reliab., 2007)

Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements. - Yuan Gao; Nicolas Guitard; Christophe Salamero; Marise Bafleur; Laurent Bary; Laurent Escotte; Patrick Gueulle; Lionel Lescouzères (Microelectron. Reliab., 2007)

Long-term stability of an SiGe HBT-based active cold load. - Emilie Leynia de la Jarrige; Laurent Escotte; Eric Gonneau; Jean-Marc Goutoule (IGARSS, 2011)