Design, Characterization & Modelling of a CMOS Magnetic Field Sensor. - Laurent Latorre; Yves Bertrand; P. Hazard; Francis Pressecq; Pascal Nouet (DATE, 1999)

Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensing. - Vincent Beroulle; Yves Bertrand; Laurent Latorre; Pascal Nouet (VLSI-SOC, 2001)

Impact of Technology Spreading on MEMS design Robustness. - Vincent Beroulle; Laurent Latorre; M. Dardalhon; Coumar Oudéa; Guy Perez; Francis Pressecq; Pascal Nouet (VLSI-SOC, 2001)

Test and Testability of a Monolithic MEMS for Magnetic Field Sensing. - Vincent Beroulle; Yves Bertrand; Laurent Latorre; Pascal Nouet (J. Electron. Test., 2001)

On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems. - Vincent Beroulle; Yves Bertrand; Laurent Latorre; Pascal Nouet (DATE, 2002)

European Network for Test Education. - Yves Bertrand; Marie-Lise Flottes; Florence Azaïs; Serge Bernard; Laurent Latorre; Regis Lorival (DELTA, 2002)

Testing Resonant Micro-Electro-Mechanical Sensors using the Oscillation-based Test Methodology. - Vincent Beroulle; Yves Bertrand; Laurent Latorre; Pascal Nouet (LATW, 2002)

Evaluation of the Oscillation-based Test Methodology for Micro-Electro-Mechanical Systems. - Vincent Beroulle; Yves Bertrand; Laurent Latorre; Pascal Nouet (VTS, 2002)

Reliability analysis of CMOS MEMS structures obtained by Front Side Bulk Micromachining. - M. Dardalhon; Vincent Beroulle; Laurent Latorre; Pascal Nouet; Guy Perez; Jean Marc Nicot; Coumar Oudéa (Microelectron. Reliab., 2002)

Electrically-induced thermal stimuli for MEMS testing. - Norbert Dumas; Florence Azaïs; Laurent Latorre; Pascal Nouet (ETS, 2004)

Design of CMOS MEMS based on mechanical resonators using a RF simulation approach. - Laurent Latorre; Vincent Beroulle; Pascal Nouet (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004)

Towards on-line testing of MEMS using electro-thermal excitation. - Frédérick Mailly; Florence Azaïs; Norbert Dumas; Laurent Latorre; Pascal Nouet (ETS, 2005)

Test Engineering Education in Europe - The CRTC experience through the EuNICE-Test project. - Laurent Latorre; Yves Bertrand; Michel Robert; Marie-Lise Flottes (EDUTECH, 2005)

On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor. - Norbert Dumas; Florence Azaïs; Laurent Latorre; Pascal Nouet (VTS, 2005)

Electro-thermal Stimuli for MEMS Testing in FSBM Technology. - Norbert Dumas; Florence Azaïs; Laurent Latorre; Pascal Nouet (J. Electron. Test., 2006)

A 2-D VHDL-AMS Model for Disk-Shape Piezoelectric Transducers. - Jean-Marc Gallière; Philippe Papet; Laurent Latorre (BMAS, 2008)

A CMOS Multi-sensor System for 3D Orientation Determination. - Boris Alandry; Norbert Dumas; Laurent Latorre; Frédérick Mailly; Pascal Nouet (ISVLSI, 2008)

A Closed-Loop Architecture with Digital Output for Convective Accelerometers. - Olivier Leman; Laurent Latorre; Frédérick Mailly; Pascal Nouet (ISVLSI, 2008)

Study of First-Order Thermal Sigma-Delta Architecture for Convective Accelerometers - Olivier Leman; Frédérick Mailly; Laurent Latorre; Pascal Nouet (CoRR, 2008)

Rejection of Power Supply Noise in Wheatstone Bridges : Application to Piezoresistive MEMS - El Mehdi Boujamaa; Yannick Soulie; Frédérick Mailly; Laurent Latorre; Pascal Nouet (CoRR, 2008)

Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals Using Digital ATE. - Nicolas Pous; Florence Azaïs; Laurent Latorre; Pascal Nouet; Jochen Rivoir (Asian Test Symposium, 2009)

Integrated Circuits Testing: Remote Access to Test Equipment for Labs and Engineering. - Laurent Latorre; Beatrice Pradarelli; Pascal Nouet (Int. J. Online Eng., 2009)

Remote Labs for Industrial IC Testing. - Beatrice Pradarelli; Laurent Latorre; Marie-Lise Flottes; Yves Bertrand; Pascal Nouet (IEEE Trans. Learn. Technol., 2009)

On the use of standard digital ATE for the analysis of RF signals. - Nicolas Pous; Florence Azaïs; Laurent Latorre; Jochen Rivoir (ETS, 2010)

A low power interface circuit for resistive sensors with digital offset compensation. - El Mehdi Boujamaa; Boris Alandry; Souha Hacine; Laurent Latorre; Frédérick Mailly; Pascal Nouet (ISCAS, 2010)

Experiments on the analysis of phase/frequency-modulated RF signals using digital tester channels. - Nicolas Pous; Florence Azaïs; Laurent Latorre; Pascal Nouet; Jochen Rivoir (LATW, 2010)

A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources. - Nicolas Pous; Florence Azaïs; Laurent Latorre; Jochen Rivoir (J. Electron. Test., 2011)

An efficient control variates method for yield estimation of analog circuits based on a local model. - Pierre-Francois Desrumaux; Yoan Dupret; Jens Tingleff; Sean Minehane; Mark Redford; Laurent Latorre; Pascal Nouet (ICCAD, 2012)

Low-cost SNR estimation of analog signals using standard digital automated test equipment (ATE). - Florence Azaïs; Laurent Latorre (NEWCAS, 2012)

Study of a high-resolution and low-power CMOS temperature sensor. - Souha Hacine; Frédérick Mailly; Laurent Latorre; Pascal Nouet (NEWCAS, 2012)

Low-cost phase noise testing of complex RF ICs using standard digital ATE. - Stephane David-Grignot; Florence Azaïs; Laurent Latorre; Francois Lefevre (ITC, 2014)

Phase noise measurement on IF analog signals using standard digital ATE resources. - Stephane David-Grignot; Florence Azaïs; Laurent Latorre; Francois Lefevre (NEWCAS, 2014)

Embedded Test Instrument for On-Chip Phase Noise Evaluation of Analog/IF Signals. - Florence Azaïs; Stephane David-Grignot; Laurent Latorre; Francois Lefevre (DDECS, 2015)

A new technique for low-cost phase noise production testing from 1-bit signal acquisition. - Stephane David-Grignot; Florence Azaïs; Laurent Latorre; Francois Lefevre (ETS, 2015)

A digital technique for the evaluation of SSB phase noise of analog/RF signals. - Florence Azaïs; Stephane David-Grignot; Laurent Latorre; Francois Lefevre (LATS, 2015)

Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range. - Stephane David-Grignot; Florence Azaïs; Laurent Latorre; Francois Lefevre (J. Electron. Test., 2015)

Industrial test project oriented education. - Beatrice Pradarelli; Pascal Nouet; Laurent Latorre (EDUCON, 2016)

Per peers learning educational approach to teach industrial test to undergraduate students. - Beatrice Pradarelli; Pascal Nouet; Laurent Latorre (EWME, 2016)

Problem-Based Learning Approach to Teach Printed Circuit Boards Test. - Beatrice Pradarelli; Pascal Nouet; Laurent Latorre (ICL (1), 2016)

SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE. - Florence Azaïs; Stephane David-Grignot; Laurent Latorre; Francois Lefevre (J. Electron. Test., 2016)

Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits. - Florence Azaïs; Stephane David-Grignot; Laurent Latorre; Francois Lefevre (J. Circuits Syst. Comput., 2016)

Combo of innovative educational approaches to teach industrial test to undergraduate students. - Beatrice Pradarelli; Pascal Nouet; Laurent Latorre (EDUCON, 2017)

Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE. - T. Vayssade; Florence Azaïs; Laurent Latorre; Francois Lefevre (IOLTS, 2018)

Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition. - T. Vayssade; Florence Azaïs; Laurent Latorre; Francois Lefevre (ETS, 2019)

EVM measurement of RF ZigBee transceivers using standard digital ATE. - T. Vayssade; Florence Azaïs; Laurent Latorre; François Lefevre (DFT, 2020)

Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. - Florence Azaïs; Serge Bernard; Mariane Comte; Bastien Deveautour; Sophie Dupuis; Hassan El Badawi; Marie-Lise Flottes; Patrick Girard 001; Vincent Kerzèrho; Laurent Latorre; François Lefèvre; Bruno Rouzeyre; et al. (IOLTS, 2020)

Digital test of ZigBee transmitters: Validation in industrial test environment. - Thibault Vayssade; Florence Azaïs; Laurent Latorre; François Lefèvre (DATE, 2021)

Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli. - Thibault Vayssade; Mouhamad Chehaitly; Florence Azaïs; Laurent Latorre; François Lefèvre (ETS, 2021)

Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled Acquisition. - T. Vayssade; Florence Azaïs; Laurent Latorre; François Lefèvre (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021)

Addressing Power Issues in Biologging: An Audio/Inertial Recorder Case Study. - Jonathan Miquel; Laurent Latorre; Simon Chamaillé-Jammes (Sensors, 2022)

Low-cost digital solution for production test of ZigBee transmitters Special Session "AMS-RF testing". - Thibault Vayssade; Florence Azaïs; Laurent Latorre; François Lefèvre (LATS, 2023)

Low-cost generation of RF test stimuli from baseband digital signals. - Kamilia Tahraoui; T. Vayssade; François Lefèvre; Laurent Latorre; Florence Azaïs (ATS, 2024)

Digital Generation of RF Phase-Modulated Test Stimuli: Application to BPSK Modulation Scheme. - Kamilia Tahraoui; R. Burelle; T. Vayssade; François Lefevre; Laurent Latorre; Florence Azaïs (DFT, 2024)

Digital generation of single tone FM/PM test stimuli: a theoretical analysis. - Kamilia Tahraoui; T. Vayssade; François Lefèvre; Laurent Latorre; Florence Azaïs (LATS, 2024)

Digital-Based Solution for the Generation of FM/PM Test Stimuli. - Kamilia Tahraoui; Thibault Vayssade; François Lefevre; Laurent Latorre; Florence Azaïs (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2025)