A New Embedded Measurement Structure for eDRAM Capacitor. - Laurent Lopez; Jean-Michel Portal; Didier Née (DATE, 2005)

A new method to quantify retention-failed cells of an EEPROM CAST. - Claire Le Roux; Laurent Lopez; Abdellatif Firiti; Jean-Luc Ogier; Frédéric Lalande; Romain Laffont; Gilles Micolau (Microelectron. Reliab., 2007)

Temperature and hump effect impact on output voltage spread of low power bandgap designed in the sub-threshold area. - Y. Joly; L. Truphemus; Laurent Lopez; Jean-Michel Portal; Hassen Aziza; Franck Julien; Pascal Fornara (ISCAS, 2011)

Matching degradation of threshold voltage and gate voltage of NMOSFET after Hot Carrier Injection stress. - Y. Joly; Laurent Lopez; Jean-Michel Portal; Hassen Aziza; Jean-Luc Ogier; Y. Bert; Franck Julien; Pascal Fornara (Microelectron. Reliab., 2011)

Effect of ions presence in the SiOCH inter metal dielectric structure. - Benjamin Rebuffat; Vincenzo Della Marca; Pascal Masson; Jean-Luc Ogier; Marc Mantelli; Olivier Paulet; Laurent Lopez; Romain Laffont (ESSDERC, 2013)

Dynamic power reduction through process and design optimizations on CMOS 80 nm embedded non-volatile memories technology. - Jordan Innocenti; Loic Welter; Franck Julien; Laurent Lopez; Jacques Sonzogni; Stephan Niel; Arnaud Régnier; Emmanuel Paire; Karen Labory; Eric Denis; Jean-Michel Portal; Pascal Masson (MWSCAS, 2014)

Layout optimizations to decrease internal power and area in digital CMOS standard cells. - Jordan Innocenti; Franck Julien; Jean-Michel Portal; Laurent Lopez; Q. Hubert; Pascal Masson; Jacques Sonzogni; Stephan Niel; Arnaud Régnier (MIPRO, 2015)

Dynamic current reduction of CMOS digital circuits through design and process optimization. - Jordan Innocenti; Loïc Welter; Nicolas Borrel; Franck Julien; Jean-Michel Portal; Jacques Sonzogni; Laurent Lopez; Pascal Masson; Stephan Niel; Philippe Dreux; Julia Castellan (PATMOS, 2015)

Improvement of MOSFET matching characterization with calibrated multiplexed test structure. - Loic Welter; J. L. Scotto di Quaquero; Philippe Dreux; Laurent Lopez; Hassen Aziza; Jean-Michel Portal (Microelectron. Reliab., 2015)