Fast Measurement of BTI on 28nm Fully Depleted Silicon-On-Insulator MOSFETs at Cryogenic Temperature down to 4K. - Lauriane Contamin; Mikaël Cassé; Xavier Garros; Fred Gaillard; Maud Vinet; Philippe Galy; André Juge; Emmanuel Vincent 004; Silvano De Franceschi; Tristan Meunier (IRPS, 2022)

Specificities of linear Si QD arrays integration and characterization. - Heimanu Niebojewski; Benoit Bertrand; Etienne Nowak; Thomas Bedecarrats; Bruna Cardoso Paz; Lauriane Contamin; Pierre-André Mortemousque; V. Labracherie; L. Brevard; H. Sahin; Jean Charbonnier; C. Thomas; et al. (VLSI Technology and Circuits, 2022)