Efficient Grouping of Fail Chips for Volume Yield Diagnostics. - Lavanya Jagan; Ratan Deep Singh; V. Kamakoti 001; Ananta K. Majhi (VLSI Design, 2009)

Impact of Temperature on Test Quality. - Lavanya Jagan; Camelia Hora; Bram Kruseman; Stefan Eichenberger; Ananta K. Majhi; V. Kamakoti 001 (VLSI Design, 2010)