Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance. - Kumar L. Parthasarathy; Le Jin; Turker Kuyel; Dana Price; Degang Chen 001; Randall L. Geiger (ISCAS (5), 2003)

Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs. - Le Jin; Kumar L. Parthasarathy; Turker Kuyel; Degang Chen 001; Randall L. Geiger (ITC, 2003)

BIST and production testing of ADCs using imprecise stimulus. - Kumar L. Parthasarathy; Turker Kuyel; Dana Price; Le Jin; Degang Chen 001; Randall L. Geiger (ACM Trans. Design Autom. Electr. Syst., 2003)

Robust design of high gain amplifiers using dynamical systems and bifurcation theory. - Chengming He; Le Jin; Degang Chen 001; Randall L. Geiger (ISCAS (1), 2004)

An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli. - Le Jin; Chengming He; Degang Chen 001; Randall L. Geiger (ISCAS (1), 2004)

Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals. - Le Jin; Chengming He; Degang Chen 001; Randall L. Geiger (ISCAS (1), 2004)

A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals. - Le Jin; Degang Chen 001; Randall L. Geiger (ISCAS (2), 2005)

A test strategy for time-to-digital converters using dynamic element matching and dithering. - Wenbo Liu; Hanqing Xing; Le Jin; Randall L. Geiger; Degang Chen 001 (ISCAS (4), 2005)

High-performance ADC linearity test using low-precision signals in non-stationary environments. - Le Jin; Kumar L. Parthasarathy; Turker Kuyel; Randall L. Geiger; Degang Chen 001 (ITC, 2005)

Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal. - Le Jin; Kumar L. Parthasarathy; Turker Kuyel; Degang Chen 001; Randall L. Geiger (IEEE Trans. Instrum. Meas., 2005)

A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient. - Le Jin; Hanqing Xing; Degang Chen 001; Randall L. Geiger (ISCAS, 2006)

Characterization of a current-mode bandgap circuit structure for high-precision reference applications. - Hanqing Xing; Le Jin; Degang Chen 001; Randall L. Geiger (ISCAS, 2006)

Linearity Test of Analog-to-Digital Converters Using Kalman Filtering. - Le Jin; Degang Chen 001; Randall L. Geiger (ITC, 2006)

Testing of Precision DACs Using Low-Resolution ADCs with Dithering. - Le Jin; Hosam Haggag; Randall L. Geiger; Degang Chen 001 (ITC, 2006)

Robust High-Gain Amplifier Design Using Dynamical Systems and Bifurcation Theory With Digital Postprocessing Techniques. - Chengming He; Le Jin; Degang Chen 001; Randy Geiger (IEEE Trans. Circuits Syst. I Regul. Pap., 2007)

SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving. - Le Jin; Degang Chen 001; Randall L. Geiger (IEEE Trans. Instrum. Meas., 2007)

System identification -based reduced-code testing for pipeline ADCs' linearity test. - Hanqing Xing; Degang Chen 001; Randall L. Geiger; Le Jin (ISCAS, 2008)

Linearity Test Time Reduction for Analog-to-Digital Converters Using the Kalman Filter with Experimental Parameter Estimation. - Le Jin (ITC, 2008)

Dynamic Network Selection for Multicast Services in Wireless Cooperative Networks. - Liang Chen 007; Le Jin; Feng He; Hanwen Cheng; Lenan Wu (IEICE Trans. Commun., 2008)

Testing of Precision DAC Using Low-Resolution ADC With Wobbling. - Le Jin; Hosam Haggag; Randall L. Geiger; Degang Chen 001 (IEEE Trans. Instrum. Meas., 2008)

Low Cost Dynamic Test Methodology for High Precision ΣD ADCs. - Sehun Kook; Hyun Woo Choi; Vishwanath Natarajan; Abhijit Chatterjee; Alfred V. Gomes; Shalabh Goyal; Le Jin (Asian Test Symposium, 2009)

Grey Synthetical Prediction Model of Military Logistics Based on Evolutionary Neural Network. - Jin Yu; Limin Zhi; Yunming Qiu; Le Jin; Hailu Du (CSO (1), 2009)

Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation. - Sehun Kook; Vishwanath Natarajan; Abhijit Chatterjee; Shalabh Goyal; Le Jin (ETS, 2009)

Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. - Le Jin; Degang Chen 001; Randall L. Geiger (IEEE Trans. Instrum. Meas., 2009)

INL based dynamic performance estimation for ADC BIST. - Jingbo Duan; Le Jin; Degang Chen 001 (ISCAS, 2010)

A new method for estimating spectral performance of ADC from INL. - Jingbo Duan; Le Jin; Degang Chen 001 (ITC, 2010)

A power-of-two FFT algorithm and structure for DRM receiver. - Le Jin; Lin Liang (IEEE Trans. Consumer Electron., 2010)

Application of the Kalman Filter in Linearity Testing of Analog-to-Digital Converters. - Le Jin (J. Electron. Test., 2011)

Testing ADC Spectral Performance Without Dedicated Data Acquisition. - Jingbo Duan; Le Jin; Degang Chen 001 (IEEE Trans. Instrum. Meas., 2012)

PM-Blade: A Persistent Memory Augmented LSM-tree Storage for Database. - Yinan Zhang; Huiqi Hu; Xuan Zhou 001; Enlong Xie; Hongdi Ren; Le Jin (ICDE, 2023)

A FPGA-Based Iterative 6DoF Pose Refinement Processing Unit for Fast and Energy-Efficient Pose Estimation in Picking Robots. - Teng Zhang; Minghui Yang; Le Jin; Guoshun Zhou; Xuefeng Zhao; Chao Shi; Xingyu Yuan; Liang Zhou; Liang Chang 002; Jun Zhou 017 (IECON, 2023)

IRPE: Instance-level reconstruction-based 6D pose estimator. - Le Jin; Guoshun Zhou; Zherong Liu; Yuanchao Yu; Teng Zhang; Minghui Yang; Jun Zhou 017 (Image Vis. Comput., 2025)