Scanning SQUID microscopy for current imaging. - Lee A. Knauss; A. B. Cawthorne; N. Lettsome; S. Kelly; S. Chatraphorn; E. F. Fleet; F. C. Wellstood; W. E. Vanderlinde (Microelectron. Reliab., 2001)

Advances in scanning SQUID microscopy for die-level and package-level fault isolation. - Lee A. Knauss; Antonio Orozco; Solomon I. Woods; Alfred B. Cawthorne (Microelectron. Reliab., 2003)