A closed-loop IGBT non-destructive tester. - Ashraf Ahmed; Yasaman Shadrokh; Lee Coulbeck; Alberto Castellazzi; C. Mark Johnson (Microelectron. Reliab., 2012)

Optimization of p-emitter/n-buffer using laser annealing technique in IGBT design. - Chunlin Zhu; Ian Deviny; Ben Yu; Lee Coulbeck; Gary Liu; Jim Thomson (IECON, 2013)

Substrate Solder Crack Evaluation and Modelling of Power Module under Passive Cycling. - Zhongxu Wang; Yangang Wang; Lee Coulbeck; Xiang Li 030; Wei Gong (IECON, 2021)