valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits. - John Gatej; Lee Song; Carol Pyron; Rajesh Raina; Tom Munns (ITC, 2002)

A Successful DFT Tester: What Will It Look Like? Is DFT Tester a Logical Next Step in ATE Evolution? - Bill Bottoms; Lee Song; Paul Patton; Wilhelm Radermacher (VTS, 2002)

Analog and Mixed Signal BIST: Too Much, Too Little, Too Late? - Adam Osseiran; William De Wilkins; Barry Baril; Sassan Tabatabaei; Fidel Muradali; Ken Posse; Lee Song (VTS, 2002)

A Successful DFT Tester: What Will It Look Like? Is Revolution in Test Approaches Required? - Lee Song; Rudy Garcia; Andrew Levy; Donald L. Wheater (VTS, 2002)